Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science

Automatic 3D Reconstruction by Deep Learning Neural Networks Using Images Acquired via 4D-STEM Stereo Imaging

Correlative Mapping with AFM, STEM HAADF, and PF-QNM/SROM of Interpenetrating Networks of Elastomeric and Glassy Polymers

Determining the 3D Atomic Structure of Metallic Glass

High throughput Imaging and Increasing Resolution of X-ray Imaging at High Acceleration Voltages

Imaging and Understanding Metal Organic Frameworks Using Advanced Scanning Electron Microscopy Techniques

Increasing Resolution of X-ray Imaging at High Acceleration Voltages

Single-Atom Level Determination of 3D Surface Atomic Structure via Neural Network-Assisted Atomic Electron Tomography

Structural and Chemical Characterization of Janus Nanoparticles with 2D and 3D Electron Microscopy

Volume Imaging By Tracking Sparse Topological Features In Electron Micrograph Tilt Series

Simultaneous Neutron and X-ray Tomography for Materials Research

Investigations of Silicon-Based Anodes for Li-Ion Batteries Using X-Ray and Neutron 3D/4D Imaging Techniques

4D Reconstructions from Microscale Photogrammetry: Correlation of 3D Surface Representations with SIMS to Link Microstructural Topography and Chemical Information

Cryo-Electron Tomography for Imaging and Quantitative Analysis of Beam-Sensitive Fuel Cell Materials

Acquisition to Visualization: New Approaches in Dynamic In-situ X-ray Imaging

Analysis of Fibers, Pores, and Mechanical Properties in μCT-scan of a Long Fiber-Reinforced Thermoplastic

Impact of Chemical Composition on 3D Elemental Distribution and Damage Behavior of Cast Al-Si Alloys

In-situ 3D X-ray Tomography and Analysis of Reverse Osmosis Membranes Under Compaction

Investigation of the Multiscale Microstructure of an Age-Hardenable Metal Matrix Composite using Correlative Microscopy

MetalJet X-ray Sources for High-Speed Imaging

Morphology and Growth Habit of a Novel Flux-Grown Layered Semiconductor KBiS2 Revealed by Lab-based Diffraction-Contrast Tomography

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science